Abstract |
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In this study, an analytical method for the
static deflection of an AFM nonuniform probe subjected to
tip-sample forces is presented. The effects of the
Lennard-Jones and electrostatic noncontact forces and a contact
force on the deflection of a cantilever are investigated.
The contact force is simulated by the
Derjaguin–Muller–Toporov model. In general, when an
atomic force microscopy is used to measure a sample’s
topography and properties, a jump phenomenon of a cantilever
usually exists. Unfortunately, there is a lack of a complete and
precise description about this jump phenomenon. This proposed
analytical method is helpful to investigate precisely the jump
phenomenon. Moreover, the effects of several parameters on
the jump phenomenon are studied. Finally, several simple and
general relations between the deflection of beam and the
tip-sample distance are presented.
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Keywords
AFM, exact solution, contact force
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Authors
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