Abstract

This paper investigates the electroelastic interaction between a dislocation and collinear interfacial rigid lines in two dissimilar piezoelectric materials subjected to remote loadings. Both conducting and dielectric rigid lines are considered. The general solutions for the field variables are obtained based on the Stroh formalism and analytical function theory. The stress and electric displacement fields at the tips of rigid conducting lines are present as either a square root singularity or a combination of any two of the three kinds of singularities: square root singularity, nonsquare root singularity and oscillatory singularity. The stress and electric displacement fields at the tips of rigid dielectric lines exhibit either a square root singularity or a combination of square root and oscillatory singularities. Singularities depend on the electroelastic properties of the two piezoelectric materials. The rigid line extension force is expressed in terms of the strain and electric field intensity factors which are analogous to the stress and electric displacement intensity factors defined for interfacial cracks. The exact field solutions for the case of a single interfacial rigid line are presented. The tangential and radial components of the image force on the dislocation are calculated. Numerical examples are presented to demonstrate the effects of some important parameters on the image force.

Keywords

piezoelectric, bimaterials, dislocation, rigid lines, interface, energy release rate, image force

Authors